High Characteristic Temperature of Highly Stacked Quantum-Dot Laser for 1.55-μm Band
High Characteristic Temperature of Highly Stacked Quantum-Dot Laser for 1.55-μm Band
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DOI:
10.1109/lpt.2009.2035821
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发表时间:
2010-01-15
影响因子:
2.6
通讯作者:
Kawanishi, Tetsuya
中科院分区:
文献类型:
--
作者:
Akahane, Kouichi;Yamamoto, Naokatsu;Kawanishi, Tetsuya
We fabricated broad-area laser diodes comprising 30-layer stacks of InAs quantum dots (QDs) by using strain compensation. The devices exhibited ground-state lasing at 1529 nm in pulsed mode with a high characteristic temperature of 113 K around room temperature (20 degrees C-80 degrees C). Ground-state lasing was achieved because of the high QD density afforded by strain compensation.