Thickness dependent functional properties of PbZr0.52Ti0.48O3/La0.67Sr0.33MnO3 heterostructures
Thickness dependent functional properties of PbZr0.52Ti0.48O3/La0.67Sr0.33MnO3 heterostructures
复制标题
DOI：
10.1063/1.4848017
复制
发表时间：
2013-12
影响因子：
3.2
通讯作者：
D. Barrionuevo;N. Ortega;Atin Kumar;R. Chatterjee;J. Scott;R. Katiyar
中科院分区：
文献类型：
--
作者：
D. Barrionuevo;N. Ortega;Atin Kumar;R. Chatterjee;J. Scott;R. Katiyar
采用脉冲激光沉积技术在La0.67Sr0.33MnO3/（LaAlO 3）0.3（Sr 2AlTaO 6）0.7（LSMO/LSAT）（001）基片上制备了厚度为100（P100）~ 10（P10）nm的PbZr0.52Ti0.48O3（PZT）超薄铁电薄膜。异质结构的X射线衍射图案仅显示对应于LSAT衬底、PZT和LSMO层的（00 l）（l = 1和/或2）反射。原子力显微镜研究表明，P100和P10薄膜的均方根表面粗糙度分别为2.39和0.99 nm。当PZT的厚度从10 nm增加到100 nm时，真实的（e′）和虚部（e″）的折射率都增加。在350-500 K范围内，随温度变化的e′呈现反常，与LSMO的铁磁-金属-顺磁-绝缘体转变有关。随着PZT薄膜厚度的减小，介电异常和磁相变温度向低温方向移动。价值观的余…
The ultra thin ferroelectric PbZr0.52Ti0.48O3 (PZT) films with various thicknesses ranging from 100 (P100) to 10 (P10) nm were grown on La0.67Sr0.33MnO3/(LaAlO3)0.3(Sr2AlTaO6)0.7 (LSMO/LSAT) (001) substrates deposited by pulsed laser deposition technique. The x-ray diffraction patterns of the heterostructures show only (00l) (l = 1 and/or 2) reflections corresponding to the LSAT substrate, PZT, and LSMO layers. The atomic force microscopy studies show that the root mean square surface roughnesses of P100 and P10 films are 2.39 and 0.99 nm, respectively. An increase of both real (e′) and imaginary (e″) permittivities was observed when thickness of PZT increases from 10 nm to 100 nm. Temperature dependent e′ presents an anomaly, related to ferromagnetic-metal to paramagnetic-insulator transition of the LSMO, in the range of 350–500 K. The dielectric anomalies and magnetic phase transition temperature shifted to the lower temperature values with decrease in the PZT films thicknesses. The values of the remane...