Rough and vicinal surfaces of helium-4 crystals. Mobility measurements
Rough and vicinal surfaces of helium-4 crystals. Mobility measurements
复制标题
氦 4 晶体的粗糙表面和邻面。
DOI：
10.1007/bf00753839
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发表时间：
1995
影响因子：
2
通讯作者：
J. Poitrenaud
中科院分区：
文献类型：
--
作者：
J. Amrit;P. Legros;J. Poitrenaud
通过研究超声波垂直于固液界面的透射系数，测量了不同晶向的4 He晶体在0.38 ~ 1 K温度范围内邻面的迁移率。结果表明，邻位迁移率的角度依赖性的理论预测。此外，在粗糙的界面相比，一个壮观的减少邻位表面的流动性，由于移动站点的数量减少是在良好的协议与前面的结果的声子项。这是第一次观察到的旋转项。
By studying the transmission coefficient of ultrasonic waves perpendicular to the solid-liquid interface, we have measured the mobility of vicinal surfaces of4He crystrals for different crystallographic orientations and in the temperature range from 0.38 K to 1 K. The results show an angular dependency of the vicinal mobility as predicted by theory. Further, in comparison with rough interfaces, a spectacular decrease for the mobility of vicinal surfaces due to the decreasing number of moving sites is in good agreement with preceeding results for the phonon term. It has been observed for the first time for the roton term.