AN UNBIASED CORRECTION FACTOR FOR CELL COUNTS IN HISTOLOGICAL SECTIONS
AN UNBIASED CORRECTION FACTOR FOR CELL COUNTS IN HISTOLOGICAL SECTIONS
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DOI：
10.1016/0165-0270(93)90117-a
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发表时间：
1993-08-01
影响因子：
3
通讯作者：
CLARKE, PGH
中科院分区：
文献类型：
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作者：
CLARKE, PGH
通过将组织学切片中的细胞（或细胞核或其他此类颗粒）的原始计数乘以“校正因子”来校正细胞（或细胞核或其他此类颗粒）的原始计数是常见的程序，以允许对切片颗粒进行多次计数。然而，标准公式的推导假设要计数的颗粒具有均匀的尺寸。因此，这些公式在实际情况中可能存在偏差。这里，导出了不依赖于该限制性假设的更一般的校正因子（C）： C = SIGMA(i=1)(m)T/(T - h(i))/SIMGA(i=1)m(T - R - S + h(i))/(T - h(i)) 其中 T 是截面厚度，h 是垂直于截面测量的粒子 i 的高度，R 和 S 是上部和下部“丢失”的高度（假定为常数） caps'，并且对从完全位于各个部分内的颗粒中随机采样的 m（大约 20）个颗粒进行求和。提出h(i)采用差分聚焦法测量；该公式将适用于不同形状和尺寸的颗粒。
It is common procedure to correct raw counts of cells (or nuclei or other such particles) in histological sections by multiplying them by a 'correction factor', to allow for sectioned particles being counted more than once. However, the derivation of the standard formulae assumes that the particles to be counted are of uniform size. Therefore, these formulae may be biased in practical situations. Here, a more general correction factor (C) not depending on this restrictive assumption is derived: C = SIGMA(i=1)(m)T/(T - h(i))/SIMGA(i=1)m(T - R - S + h(i))/(T - h(i)) where T is section thickness, h, is the height of particle i measured perpendicular to the section plane, R and S are the heights, assumed constant, of the upper and lower 'lost caps', and the summation is performed over m (about 20) particles sampled randomly from among those lying wholly within individual sections. It is proposed that h(i) be measured by a differential focusing method; the formula will then be valid for particles of variable shape as well as size.