On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets
On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets
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DOI：
10.1109/tcad.2016.2552822
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发表时间：
2016-12
影响因子：
2.9
通讯作者：
Stephan Eggersglüß;K. Schmitz;Rene Krenz-Baath;R. Drechsler
中科院分区：
文献类型：
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作者：
Stephan Eggersglüß;K. Schmitz;Rene Krenz-Baath;R. Drechsler
测试紧凑是后期测试中的一个重要方面，因为它可以分别减少测试数据和测试成本。目前的自动测试模式生成(ATPG)方法相互独立地处理所有的故障，这限制了测试紧凑能力。提出了一种新的基于优化可满足性(SAT)的紧凑测试集生成算法，并提出了一种新的测试集约简的重定目标阶段。ATPG基于一种使用优化技术的新的多目标测试生成公式。利用稳健的基于SAT的求解算法来确定可通过相同测试检测的兼容故障组。所提出的技术可以在初始紧凑测试生成期间以及后处理期间使用，以以迭代的方式增加现有测试集的紧凑性，例如由商业工具生成。实验结果表明，该方法能够生成高度紧凑的测试集，对固定故障和过渡故障具有较高的故障覆盖率。该方法能够产生比商业ATPG工具更低的模式计数。对于一个工业电路，测试集大小甚至可以减少到商业ATPG工具所生成大小的26%。
Test compaction is an important aspect in the post-production test since it is able to reduce the test data and the test costs, respectively. Current automatic test pattern generation (ATPG) methods treat all faults independently from each other which limits the test compaction capability. We propose a new optimization satisfiability (SAT)-based ATPG for compact test set generation with high fault coverage as well as a new retargeting stage for test set reduction. The ATPG is based on a novel multiple-target test generation formulation using optimization techniques. Robust SAT-based solving algorithms are leveraged to determine compatible fault groups which can be detected by the same test. The proposed technique can be used during initial compact test generation as well as a post-process to increase the compactness of existing test sets, e.g., generated by commercial tools, in an iterative manner. Experimental results show that the proposed SAT-based approach is able to produce highly compacted test sets with high fault coverage for stuck-at as well as transition faults. The approach is able to produce lower pattern counts than a commercial ATPG tool. For one industrial circuit, the test set size can even be reduced down to 26% of the size generated by a commercial ATPG tool.