CARBON IMPURITY CHARACTERIZATION ON A LINEAR PLASMA DEVICE USING VISIBLE EMISSION SPECTROSCOPY
CARBON IMPURITY CHARACTERIZATION ON A LINEAR PLASMA DEVICE USING VISIBLE EMISSION SPECTROSCOPY
复制标题
使用可见发射光谱对线性等离子体装置进行碳杂质表征
DOI：
10.1116/1.581935
复制
发表时间：
1999
期刊：
影响因子：
--
通讯作者：
R. Doerner
中科院分区：
文献类型：
--
作者：
D. Whyte;R. Seraydarian;R. Doerner
采用可见光发射光谱法对等离子体相互作用表面元件实验站（PISCES-B）线性等离子体偏滤器模拟器中的碳杂质浓度进行了定量分析。为了减少PISCES-B铍安全罩中设备的暴露，开发了一种非侵入性地获得可见光谱仪绝对光度校准的技术。碳的主要内在来源似乎是在容器壁的化学溅射，与氘等离子体的典型背景浓度约为0.2%。氦等离子体具有较低的碳污染，约为0.01%。甲烷气体注入是用来增加碳污染的控制方式，以更好地模拟托卡马克边缘等离子体条件。结果发现，光谱法测定碳馏分同意与残余气体分析仪测量等离子体操作过程中的相对气态碳污染。
Visible emission spectroscopy is used to quantify the carbon impurity concentration in the linear plasma divertor simulator of the Plasma Interaction Surface Component Experimental Station (PISCES-B). A technique has been developed to obtain noninvasively the absolute photometric calibration of a visible spectrometer in order to minimize exposure of equipment in the beryllium safety enclosure of PISCES-B. The principal intrinsic source of carbon appears to be chemical sputtering at the vessel walls, with a typical background concentration ∼0.2% with deuterium plasmas. Helium plasmas have a lower carbon contamination ∼0.01%. Methane gas injection is used to increase the carbon contamination in a controlled manner to better simulate tokamak edge plasma conditions. It is found that the spectroscopic method of determining the carbon fraction agrees well with the relative gaseous carbon contamination measured with a residual gas analyzer during plasma operations.