A Starry Byte — proton beam measurements of single event upsets and other radiation effects in ABCStar ASIC Versions 0 and 1 for the ITk strip tracker
A Starry Byte — proton beam measurements of single event upsets and other radiation effects in ABCStar ASIC Versions 0 and 1 for the ITk strip tracker
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A Starry Byte — 用于 ITk 带状跟踪器的 ABCStar ASIC 版本 0 和 1 中单粒子翻转和其他辐射效应的质子束测量
DOI：
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发表时间：
2022
期刊：
影响因子：
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通讯作者：
M. Warren
中科院分区：
文献类型：
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作者：
M. Basso;J. Fernandez;B. Gallop;G. Greig;J. John;P. Keener;K. Krizka;P. Leitao;B. Norman;P. Phillips;L. Poley;C. Sawyer;T. Stack;S. Stucci;D. Trischuk;M. Warren
单事件效应(SEEs) -主要是由粒子相互作用引起的电子器件中的位翻转-是在高辐射环境中运行的asic（如ABCStar asic）的主要关注点，该asic被设计用于未来的ATLAS ITk条带跟踪器。因此，优化了芯片设计，通过实现三重模块冗余（TMR）等三倍技术来保护芯片免受see的影响。为了验证芯片设计的辐射防护机制，通过将芯片暴露在高强度粒子束中同时监测观察到的seu，测量了单事件扰动（seu）的横截面，seu是一类特殊的see。本研究介绍了使用最新版本的ABCStar ASIC （ABCStar V1）使用480 MeV质子束进行的SEU测试的设置，所进行的测量和结果。
Single Event Effects (SEEs) — predominately bit-flips in electronics caused by particle interactions - are a major concern for ASICs operated in high radiation environments such as ABCStar ASICs, which are designed to be used in the future ATLAS ITk strip tracker. The chip design is therefore optimised to protect it from SEEs by implementing triplication techniques such as Triple Modular Redundancy (TMR). In order to verify the radiation protection mechanisms of the chip design, the cross-section for Single Event Upsets (SEUs), a particular class of SEEs, is measured by exposing the chip to high-intensity particle beams while monitoring it for observed SEUs. This study presents the setup, the performed measurements, and the results from SEU tests performed using the latest version of the ABCStar ASIC (ABCStar V1) using a 480 MeV proton beam.
用于 ATLAS 带状跟踪器的 ABC130 筒模块原型设计程序
影响因子：
1.3
作者：
Poley L
通讯作者：
Poley L