Identifying the Cause of Rupture of Li-Ion Batteries during Thermal Runaway.
Identifying the Cause of Rupture of Li-Ion Batteries during Thermal Runaway.
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DOI：
10.1002/advs.201700369
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发表时间：
2018-01
期刊：
影响因子：
--
通讯作者：
Shearing PR
中科院分区：
文献类型：
--
作者：
Finegan DP;Darcy E;Keyser M;Tjaden B;Heenan TMM;Jervis R;Bailey JJ;Vo NT;Magdysyuk OV;Drakopoulos M;Michiel MD;Rack A;Hinds G;Brett DJL;Shearing PR
随着锂离子电池和电池能量密度的增加，控制热失控的结果变得更加具有挑战性。如果在热失控过程中产生的高速率气体没有得到充分的通风，商业电池设计可能会破裂和爆炸，带来严重的安全问题。在这里，超高速同步加速器X射线成像以每秒20万帧的速度来表征六种不同的18650电池设计经历热失控的排气过程。第一次，导致最灾难性类型的细胞衰竭，破裂和爆炸的机制被确定并详细阐明。通过评估一种新颖的18650电池设计，该技术的实际应用得到了强调，该设计在底部有第二个通风口，可以避免导致破裂的关键阶段。在这项研究中产生的见解为电池故障提供了新的思路，并有望指导更安全的商业电池设计的发展。
As the energy density of lithium‐ion cells and batteries increases, controlling the outcomes of thermal runaway becomes more challenging. If the high rate of gas generation during thermal runaway is not adequately vented, commercial cell designs can rupture and explode, presenting serious safety concerns. Here, ultra‐high‐speed synchrotron X‐ray imaging is used at >20 000 frames per second to characterize the venting processes of six different 18650 cell designs undergoing thermal runaway. For the first time, the mechanisms that lead to the most catastrophic type of cell failure, rupture, and explosion are identified and elucidated in detail. The practical application of the technique is highlighted by evaluating a novel 18650 cell design with a second vent at the base, which is shown to avoid the critical stages that lead to rupture. The insights yielded in this study shed new light on battery failure and are expected to guide the development of safer commercial cell designs.
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影响因子：
3.2
作者：
OZAWA, K
通讯作者：
OZAWA, K
影响因子：
3.9
作者：
Lopez, Carlos F.;Jeevarajan, Judith A.;Mukherjee, Partha P.
通讯作者：
Mukherjee, Partha P.
影响因子：
2.5
作者：
Drakopoulos M;Connolley T;Reinhard C;Atwood R;Magdysyuk O;Vo N;Hart M;Connor L;Humphreys B;Howell G;Davies S;Hill T;Wilkin G;Pedersen U;Foster A;De Maio N;Basham M;Yuan F;Wanelik K
通讯作者：
Wanelik K
影响因子：
9.2
作者：
Lamb, Joshua;Orendorff, Christopher J.;Spangler, Scott W.
通讯作者：
Spangler, Scott W.
影响因子：
3.3
作者：
Finegan, Donal P.;Scheel, Mario;Shearing, Paul R.
通讯作者：
Shearing, Paul R.