An electromagnetic fault injection sensor using Hogge phase-detector

An electromagnetic fault injection sensor using Hogge phase-detector
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使用霍格鉴相器的电磁故障注入传感器

DOI:
10.1109/isqed.2017.7918333
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发表时间:
2017
期刊:
2017 18th International Symposium on Quality Electronic Design (ISQED)
影响因子:
--
通讯作者:
W. He
W. He
中科院分区:
--
文献类型:
--
作者:
J. Breier;S. Bhasin;W. He

文献摘要

被引文献

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针对嵌入式设备的故障注入攻击近年来引起了广泛的关注。EM故障注入(EMFI)作为一种高效的故障注入方法,由于其对安全芯片局部故障的穿透能力,优于其他故障注入方法。在本文中,我们提出了一个全数字的对策,用于检测在硅芯片的飞行EMFI企图。建议的逻辑包括一个看门狗环形振荡器(RO),和一个霍格相位检测器(PD)用于感测由正在进行的EMFI引起的频率扰动。在Xilinx FPGA Virtex-5 FPGA上的实验验证报告了93.15%的故障检测率和0.0069的故障率,开销可以忽略不计。用于警告注入尝试的显著安全裕度也是值得注意的。该技术是通用的,可以集成在任何VLSI设计中,因为它的轻量级和全数字架构,特别是对于安全关键的场景,如物联网(IoT)的端点。
Fault injection attack against embedded devices has attracted much attention in recent years. As a highly efficient fault injection, EM fault injection (EMFI) outperforms other injection means owing to its outstanding penetration capability in incurring local faults into security ICs. In this paper, we present an all digital countermeasure for detecting the on-the-fly EMFI attempts in silicon chips. The proposed logic consists of a watchdog ring-oscillator (RO), and a Hogge Phase Detector (PD) for sensing the frequency turbulence induced by the ongoing EMFIs. Experimental validation on Xilinx FPGA Virtex-5 FPGA reports a fault detection rate of 93.15% and a failure rate of 0.0069, with negligible overhead. A significant security margin for alerting the injection attempt is also noticeable. The technique is versatile and can be integrated in any VLSI design for its lightweight and all digital architecture, especially for the security-critical scenarios, such as the endpoints of Internet-of-Things (IoT).