SCINTILLATING SCREEN MONITORS FOR TRANSVERSE ELECTRON BEAM PROFILE DIAGNOSTICS AT THE EUROPEAN XFEL
SCINTILLATING SCREEN MONITORS FOR TRANSVERSE ELECTRON BEAM PROFILE DIAGNOSTICS AT THE EUROPEAN XFEL
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欧洲 XFEL 上用于横向电子束轮廓诊断的闪烁屏幕监视器
DOI：
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发表时间：
2013
期刊：
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通讯作者：
G. Priebe
中科院分区：
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作者：
M. Holz;G. Kube;G. Priebe
现代电子直线加速器（如自由电子激光器或注入式直线加速器）中的束流横向轮廓诊断主要基于光学渡越辐射（OTR）作为标准技术，当带电粒子束穿过具有不同介电性质的两种介质之间的边界时，在反向方向上观察到光学渡越辐射。基于现代直线加速器的第四代光源的经验表明，由于OTR发射过程中的相干效应，OTR诊断可能会失败。因此，对于目前正在汉堡建造的欧洲XFEL，横向束流剖面测量是基于荧光屏监视器。LYSO：Ce屏幕被定向为使得在屏幕边界处产生的相干OTR将在几何上被抑制。另一个特点是成像光学系统在Scheimpflug条件下工作，从而相对于CCD芯片调整锐焦平面，并显著增加表观景深。本报告概述了测量原理和监视器设置，以及实验室测试测量结果和FLASH的第一次原型测试。
Transverse beam profile diagnostics in modern electron linear accelerators as free electron lasers or injector linacs is mainly based on optical transition radiation (OTR) as standard technique which is observed in backward direction when a charged particle beam crosses the boundary between two media with different dielectric properties. The experience from modern linac based 4 th generation light sources shows that OTR diagnostics might fail because of coherence effects in the OTR emission process. As consequence, for the European XFEL which is currently under construction in Hamburg, transverse beam profile measurements are based on scintillating screen monitors. The LYSO:Ce screens are oriented such that coherent OTR generated at the screen boundaries will geometrically be suppressed. An additional feature is that the imaging optics operates in Scheimpflug condition, thus adjusting the plane of sharp focus with respect to the CCD chip, and significantly increasing the apparent depth of field. This report gives an overview of the measuring principle and the monitor setup together with results of laboratory test measurements and a first prototype test at FLASH.