Single-shot electron-beam bunch length measurements
Single-shot electron-beam bunch length measurements
复制标题
DOI：
10.1103/physrevlett.88.124801
复制
发表时间：
2002-03-25
影响因子：
8.6
通讯作者：
van der Meer, AFG
中科院分区：
文献类型：
--
作者：
Wilke, I;MacLeod, AM;van der Meer, AFG
我们报告亚皮秒电光测量单个相对论电子束的长度。纵向电子束形状被编码到啁啾激光脉冲的光谱上。电子束长度是通过分析有和没有电子束存在时获得的单个激光脉冲光谱来确定的。由于啁啾激光脉冲的长度可以很容易地改变，因此可以在不同的时间尺度上可视化电子束。这种单次成像技术是一种很有前途的实时电子束诊断方法。
We report subpicosecond electro-optic measurements of the length of individual relativistic electron bunches. The longitudinal electron-bunch shape is encoded electro-optically on to the spectrum of a chirped laser pulse. The electron-bunch length is determined by analyzing individual laser-pulse spectra obtained with and without the presence of an electron bunch. Since the length of the chirped laser pulse can be easily changed, the electron bunch can be visualized on different time scales. This single-shot imaging technique is a promising method for real-time electron-bunch diagnostics.