Dielectric modeling of oil-paper insulation systems at high DC voltage stress using a charge-carrier-based approach
Dielectric modeling of oil-paper insulation systems at high DC voltage stress using a charge-carrier-based approach
复制标题
使用基于电荷载体的方法对高直流电压应力下的油纸绝缘系统进行介电建模
DOI：
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发表时间：
2019
影响因子：
3.1
通讯作者：
R. Fritsche
中科院分区：
文献类型：
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作者：
T. Gabler;K. Backhaus;S. Grossmann;R. Fritsche
通过介电常数和比电导率来描述绝缘材料的介电行为，以估计绝缘系统的介电应力是最先进的。因此，在直流电压应力下的电场是根据绝缘材料的电导率的稳态导电场来确定的。然而，在油绝缘的安排，在高直流电压应力的裸金属电极的前面出现更高的场强，这是不能用这个模型来解释。因此，提出了一种基于电荷载流子的方法来描述油纸绝缘的介电行为。它描述了电荷载流子的运动及其对电场强度的影响。它们的漂移导致电荷载流子在电极前面的积累，这导致这些区域中的更高场强，这可以使用泊松-能斯特-普朗克方程系统进行数值计算。与基于电导率的模型相比，可以显示出根本的差异。击穿实验定性确认的期望，根据电荷载体为基础的方法。结果表明，在模拟高直流电压应力下的电场强度分布时，必须考虑基于电荷载流子的场分布。他们还表明，这些排列的介电行为无法根据最先进的模型来解释。
It is state-of-the-art to describe the dielectric behavior of an insulation material by its permittivity and its specific electric conductivity in order to estimate the dielectric stress of an insulation system. Thus, the electric field at DC voltage stress is determined according to the stationary electrical conduction field with the electric conductivity of the insulation materials. However, at oil-insulated arrangements a higher field strength in front of bare metal electrodes at high DC voltage stress occurs, which is not explainable with this model. Therefore, a charge carrier-based approach is presented to describe the dielectric behavior of the oil-paper insulation. It describes the movement of charge carriers and their effect on the electric field strength. Their drift leads to an accumulation of charge carriers in front of electrodes which results in a higher field strength in these areas, which can be calculated numerically using the Poisson-Nernst-Planck equation system. Compared to the conductivity-based model fundamental differences can be shown. Breakdown experiments qualitatively confirm the expectations according to the charge carrier-based approach. The results show that the charge carrier-based field distribution has to be considered for modelling the electrical field strength distribution at high DC voltage stress. They also show, that the dielectric behavior of these arrangements cannot be explained according to the state-of-the-art model.
影响因子：
2.4
作者：
Pham, Van Sang;Li, Zirui;Han, Jongyoon
通讯作者：
Han, Jongyoon