Robust, low-cost, and accurate detection of recycled ICs using digital signatures
Robust, low-cost, and accurate detection of recycled ICs using digital signatures
复制标题
使用数字签名对回收 IC 进行稳健、低成本且准确的检测
DOI：
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发表时间：
2018
期刊：
影响因子：
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通讯作者：
Ujjwal Guin
中科院分区：
文献类型：
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作者：
M. Alam;Sreeja Chowdhury;M. Tehranipoor;Ujjwal Guin
由于回收集成电路（IC）的质量低劣，其持续增长对我们的关键基础设施构成了严重威胁，并已成为政府和行业的主要关注点之一。这些IC的检测具有挑战性，特别是当它们使用时间较短时，因为工艺变化（特别是在较低的技术节点中）可能超过老化引起的退化。在本文中，我们提出了一种稳健，准确，低成本的解决方案，用于有效检测回收的IC，即使它们已经使用了很短的时间。所提出的解决方案利用环形振荡器（RO）和非易失性存储器。它存储RO频率、条件（例如，电源电压、温度和持续时间）以及数字签名。仿真和硅结果表明，我们可以有效地检测回收的IC使用低至一天。
The continuous growth of recycled integrated circuits (ICs) poses a serious threat to our critical infrastructures due to their inferior quality and has become one of the major concerns to the government and the industry. Detection of these ICs is challenging especially when they have been used for a short period of time, as the process variations (especially in lower technology nodes) could outpace the degradation caused by aging. In this paper, we propose a robust, accurate, and low-cost solution for efficient detection of recycled ICs, even if they have been used for a very short period of time. The proposed solution utilizes a ring oscillator (RO), and a nonvolatile memory. It stores the RO frequency, conditions (e.g., supply voltage, temperature, and duration) for the frequency measurement, and a digital signature. The simulation and silicon results demonstrate that we can effectively detect recycled ICs used as low as one day.