Ftir and dielectric studies of electrical aging in polyimide under AC voltage
Ftir and dielectric studies of electrical aging in polyimide under AC voltage
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DOI：
10.1109/tdei.2012.6180252
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发表时间：
2012-04
影响因子：
3.1
通讯作者：
Yang Yang-Yang;D. Yin;R. Xiong;Jing Shi;Fuqiang Tian;Xuan Wang;Q. Lei
中科院分区：
文献类型：
--
作者：
Yang Yang-Yang;D. Yin;R. Xiong;Jing Shi;Fuqiang Tian;Xuan Wang;Q. Lei
在3 kV交流电压（50 Hz）下对Kapton 100 HN聚酰亚胺薄膜进行了老化，并通过傅里叶变换红外光谱（FTIR）和介电性能测试研究了老化过程。FTIR光谱表明，电晕放电首先破坏了酰亚胺中的醚键、芳环中的部分C-H键和C-N-C键的横向伸缩振动。然后，随着老化时间的增加，发生包括C-N-C和C=O振动的酰亚胺基团的断裂。同时，氧化降解产生化合物，如羧酸、酮和醛。因此，介电常数ε1和损耗因子tan δ的变化取决于聚酰亚胺中极性基团的形成和某些极性键的断裂。
The Kapton 100HN polyimide films were aged under 3 kV ac voltage (50 Hz), and the aging evolution were studied by the Fourier transform infrared spectroscopy (FTIR) and the dielectric measurement. The FTIR spectra show that the ether linkage, and some of C-H bonds in aromatic rings and C-N-C bonds transverse stretching vibration in imide are firstly broken by corona discharge. Then, with the increase of aging time, the cleavage of the imide group including C-N-C and C=O vibrations occurs. At the same time, the oxidative degradation produces compounds such as carboxylic acid, ketones, and aldehydes. Accordingly, the variations of dielectric constant ε1 and the dissipation factor tan δ are dependent on the formation of the polar groups and the breakage of some polar bonds in polyimide.