Modeling and characterization of CP-PLL phase noise in presence of dead zone
Modeling and characterization of CP-PLL phase noise in presence of dead zone
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DOI:
10.1109/newcas.2014.6934054
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发表时间:
2014-06
期刊:
影响因子:
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通讯作者:
C. Hangmann;Ingo Wullner;C. Hedayat;U. Hilleringmann
中科院分区:
文献类型:
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作者:
C. Hangmann;Ingo Wullner;C. Hedayat;U. Hilleringmann
The analysis of non-linear mixed-signal systems like CP-PLLs is challenging because general theory of control systems cannot be applied easily. Therefore, CP-PLLs are designed within simulation platforms describing them on transistor-, behavioral-or linear-level. These models are often unprofitable according to the characterization capability, simulation time and computer resources when considering non-ideal effects. To avoid this, the modular and enhanced event-driven model can be used. Since this model is not applicable to combine phase noise and non-ideal effects, this paper focuses on modeling phase noise within the event-driven representation. Furthermore, an analytical description of the impact of dead zone on phase noise is given to obtain an optimized and robust system design.