Effect of localized magnetic field on the uniform ferromagnetic resonance mode in a thin film
Effect of localized magnetic field on the uniform ferromagnetic resonance mode in a thin film
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局域磁场对薄膜中均匀铁磁共振模式的影响
DOI：
10.1063/1.3123264
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发表时间：
2009
期刊：
影响因子：
--
通讯作者：
P. Hammel
中科院分区：
文献类型：
--
作者：
Yu. Obukhov;D. Pelekhov;E. Nazaretski;R. Movshovich;P. Hammel
从理论上分析了铁磁共振力显微镜（FMRFM）中微磁探针对铁磁薄膜中铁磁共振（FMR）模式的影响。我们的FMRFM力响应的分析揭示了三个制度所定义的探针扰动均匀FMR模式的程度。随着接近，FMRFM力增长更慢，因为加强探测场抑制FMR响应。我们的分析与实验数据吻合得很好，为FMRFM成像提供了理论基础。
We theoretically analyze the influence of the micromagnetic probe used in ferromagnetic resonance force microscopy (FMRFM) on the ferromagnetic resonance (FMR) modes in a thin ferromagnetic film. Our analysis of the FMRFM force response reveals three regimes defined by the extent to which the probe perturbs the uniform FMR mode. With closer approach, the FMRFM force grows more slowly because the strengthening probe field suppresses the FMR response. Our analysis agrees well with experimental data and provides theoretical foundations for FMRFM imaging.