Roughness Measurements of Soil Surfaces by Acoustic Backscatter
Roughness Measurements of Soil Surfaces by Acoustic Backscatter
复制标题
通过声学反向散射测量土壤表面的粗糙度
DOI：
10.2136/sssaj2003.2410
复制
发表时间：
2003
影响因子：
2.9
通讯作者：
R. Raspet
中科院分区：
文献类型：
--
作者：
M. Oelze;J. Sabatier;R. Raspet
厘米级土壤表面粗糙度的测量对于模拟局部土壤可蚀性非常重要。检查了声学反向散射技术在厘米尺度上量化多孔土壤粗糙度的能力。声学反向散射提供了一种廉价、移动且快速的方法来估计土壤表面的统计特性。建造了四个具有不同粗糙度的土块。使用声学反向散射技术和激光微地形计测量了四个土壤地块的表面粗糙度。表面图的粗糙度功率谱是通过激光微起伏计和声学反向散射技术测量的表面轮廓获得的。根据声学反向散射功率谱和激光微起伏计功率谱计算每个图的表面粗糙度的RMS（均方根）高度和相关长度的统计值并进行比较。当使用足够数量的数据点来绘制粗糙度功率谱时，两种估计粗糙度统计数据的技术之间的一致性被证明是良好的（<13% 差异）。声学反向散射技术似乎是快速且廉价地量化土壤表面粗糙度的潜在替代方案。
The measurement of the roughness of soil surfaces on centimeter scales is important to modeling local soil erodibility. An acoustic backscatter technique was examined for its ability to quantify the roughness of porous soil on centimeter scales. Acoustic backscatter offers the possibility of an inexpensive, mobile, and rapid means of estimating statistical properties of soil surfaces. Four soil plots were constructed with varying amounts of roughness. Surface roughness of the four soil plots was measured with the acoustic backscatter technique and a laser microreliefmeter. The roughness power spectra for the surface plots were obtained from surface profiles measured by the laser microreliefmeter and by the acoustic backscatter technique. Statistical values of the RMS (root mean square) height and correlation length of surface roughness for each plot were calculated from the acoustic backscatter power spectra and laser microreliefmeter power spectra and compared. Agreement between the two techniques for estimating roughness statistics was shown to be good (<13% difference) when an adequate amount of data points were used to map out the roughness power spectra. The acoustic backscatter technique appears to be a potential alternative to rapidly and inexpensively quantify the roughness of soil surfaces.