Electromagnetic analysis of fringed microstrip lines on porosified LTCC
Electromagnetic analysis of fringed microstrip lines on porosified LTCC
复制标题
多孔 LTCC 上的条纹微带线的电磁分析
DOI：
--
复制
发表时间：
2013
期刊：
影响因子：
--
通讯作者：
A. Koelpin
中科院分区：
文献类型：
--
作者：
A. Talai;Frank Steinhauser;B. Gmeiner;A. Bittner;U. Rude;U. Schmid;R. Weigel;A. Koelpin
最近的研究表明，LTCC的多孔化使得能够局部修改材料特性，特别是有效介电常数。这些研究表明，电场强度在多孔化基板上的较低导体轨道边缘处最高。由于近表面材料磨损，局部场强峰值对介电常数降低的有效性造成实质性影响。在本文中，这些随机边缘的电磁性能的影响进行了研究，不同程度的磨损。将获得的结果与通过共烧和后烧金导体的扫描电子显微镜图像分析测量的丝网印刷边缘进行比较，将有助于未来多孔LTCC上可靠的电路设计。
Recent investigations demonstrated that porosification of LTCC enables a local modification of material properties, in particular of the effective permittivity. These studies revealed that the electric field strength is highest at the lower conductor track edges on the porosified substrate. The local field strength peaks cause substantial influence on the effectiveness of permittivity reduction due near-surface material abrasions. In this paper, the influences of these randomly fringed boundaries on electromagnetic properties are investigated for different degrees of fraying. The gained results are compared to measured screen print edges by scanning electron microscope image analysis of co-fired and post-fired gold conductors, and will contribute for reliable circuit design on porous LTCC in the future.