SiGe HBT modeling for mm-wave circuit design
SiGe HBT modeling for mm-wave circuit design
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DOI:
10.1109/bctm.2015.7340560
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发表时间:
2015-12
期刊:
影响因子:
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通讯作者:
A. Pawlak;S. Lehmann;P. Sakalas;J. Krause;K. Aufinger;B. Ardouin;M. Schroter
中科院分区:
文献类型:
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作者:
A. Pawlak;S. Lehmann;P. Sakalas;J. Krause;K. Aufinger;B. Ardouin;M. Schroter
An overview on the compact modeling activities within the DOTSEVEN project is given. Issues such as geometry scaling, substrate coupling and thermal effects as well as HICUM Level 2 features enabling the accurate modeling of the linear and non-linear characteristics of the latest generation of SiGe HBTs are discussed. Furthermore, experimental results for the most important DC and small-signal characteristics as well as selected examples for non-linear modeling of the most advanced SiGe HBTs from two different technologies are presented. Model verification issues related to limited on-wafer high-frequency measurement capability and the accurate calibration at multi-hundred GHz are briefly touched.