Investigation of Fluorescence Emission from CdSe Nanorods in PMMA and P3HT/PMMA Films
Investigation of Fluorescence Emission from CdSe Nanorods in PMMA and P3HT/PMMA Films
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PMMA 和 P3HT/PMMA 薄膜中 CdSe 纳米棒的荧光发射研究
DOI:
10.1021/jp404585j
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发表时间:
2013
期刊:
影响因子:
--
通讯作者:
Chikan, Viktor
中科院分区:
文献类型:
--
作者:
Sarkany, Lorinc;Wasylenko, Jenna M.;Roy, Santanu;Higgins, Daniel A.;Elles, Christopher G.;Chikan, Viktor
Complementary fluorescence microscopy and ultrafast transient absorption spectroscopy measurements spanning a range of time scales from seconds to femtoseconds probe the interfacial dynamics of charge carriers in CdSe nanorod/polymer blends. Together, these very different techniques provide new information about the origin and dynamics of below-band-edge emission from CdSe nanorods in CdSe/PMMA and CdSe/P3HT/PMMA films [PMMA = poly(methyl methacrylate); P3HT = poly(3-hexylthiophene)]. Emission below the band edge of the CdSe nanorods is associated with surface defects (traps) at the nanoparticle/polymer interface, where conduction band electrons radiatively relax to the intraband defect sites. The fluorescence microscopy experiments simultaneously monitor both the trap emission and the band edge emission from single nanoparticles, and reveal that the two emission channels are distinct. Transitions between the two emissive states occur on time scales longer than ∼20 ms, and always involve an intermediate dark state in which no emission is observed. The presence of P3HT increases the relative band edge emission intensity and reduces the fluorescence intermittency (blinking) of both emissive states. The ultrafast transient absorption experiments monitor the evolution of a stimulated emission band below the CdSe band edge following excitation of P3HT. The measurements reveal ultrafast electron transfer from photoexcited P3HT to the CdSe nanorods within the instrument response time of approximately 140 fs, and confirm that there is strong coupling between the nanorods and P3HT in these dilute blends. Analysis of separate CdSe nanorod etching experiments suggests that the trap states are formed by the removal of atoms from the ends of the nanorods in the presence of chloroform. Mechanisms for charge trapping at the nanoparticle/polymer interface are discussed.
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DOI:
--
发表时间:
1998
期刊:
影响因子:
--
作者:
Hanming Wang;Angela M. Bardo;M. Collinson;D. Higgins
通讯作者:
D. Higgins
影响因子:
17.1
作者:
K. Knappenberger;Daryl B. Wong;W. Xu;A. Schwartzberg;A. Wolcott;J. Zhang;S. Leone
通讯作者:
K. Knappenberger;Daryl B. Wong;W. Xu;A. Schwartzberg;A. Wolcott;J. Zhang;S. Leone
影响因子:
3.3
作者:
Khanh Hoa Tran Ba;Everett, Thomas A.;Higgins, Daniel A.
通讯作者:
Higgins, Daniel A.
影响因子:
4.4
作者:
Kuno, M;Fromm, DP;Nesbitt, DJ
通讯作者:
Nesbitt, DJ
影响因子:
3.7
作者:
Santanu Roy;A. Aguirre;D. Higgins;V. Chikán
通讯作者:
V. Chikán