Exploring the Association Between EEG Microstates During Resting-State and Error-Related Activity in Young Children.

Exploring the Association Between EEG Microstates During Resting-State and Error-Related Activity in Young Children.
复制标题

探索幼儿静息状态下脑电图微状态与错误相关活动之间的关联。

DOI:
10.1007/s10548-023-01030-2
复制
发表时间:
2023
期刊:
影响因子:
2.7
通讯作者:
Gaffrey,MichaelS
Gaffrey,MichaelS
中科院分区:
医学3区
文献类型:
--
作者:
Bagdasarov,Armen;Roberts,Kenneth;Brunet,Denis;Michel,ChristophM;Gaffrey,MichaelS

文献摘要

相似文献

错误相关负波(error-related negativity,ERN)是指错误发生后,额中央头皮部位的脑电图(electroencephalography,EEG)波形发生负向偏转。ERN与整个头皮上测量的支持儿童早期错误处理的更广泛的大脑活动模式之间的关系尚不清楚。我们研究了90名4-8岁儿童在进行/不进行任务和休息状态下ERN和EEG微观状态之间的关系-动态演变的头皮电位地形图的全脑模式,反映了同步神经活动的周期。ERN的平均幅度在相对于错误发生的-64至108毫秒(ms)时间段内进行量化,这是由错误相关活动的数据驱动的微状态分割确定的。我们发现,ERN的幅度越大,全球解释方差(GEV;即,由给定的微状态解释的数据中的总方差的百分比)在相同的-64到108毫秒周期期间观察到的误差相关的微状态(即,错误相关的微观状态3),以及更大的焦虑风险,由父母报告的行为抑制测量。在静止状态,六个数据驱动的微观状态被确定。更大幅度的ERN和更大的GEV值的错误相关的microstate 3与更大的GEV值的休息状态microstate 4,这表明了额中央头皮地形。源定位结果揭示了错误相关微状态3和静息态微状态4的潜在神经发生器与规范脑网络之间的重叠(例如,腹侧注意),已知支持涉及错误处理的高阶认知过程。综上所述,我们的研究结果阐明了错误相关和内在大脑活动的个体差异是如何相关的,并增强了我们对儿童早期支持错误处理的大脑网络功能和组织的理解。
The error-related negativity (ERN) is a negative deflection in the electroencephalography (EEG) waveform at frontal-central scalp sites that occurs after error commission. The relationship between the ERN and broader patterns of brain activity measured across the entire scalp that support error processing during early childhood is unclear. We examined the relationship between the ERN and EEG microstates – whole-brain patterns of dynamically evolving scalp potential topographies that reflect periods of synchronized neural activity – during both a go/no-go task and resting-state in 90, 4-8-year-old children. The mean amplitude of the ERN was quantified during the -64 to 108 millisecond (ms) period of time relative to error commission, which was determined by data-driven microstate segmentation of error-related activity. We found that greater magnitude of the ERN associated with greater global explained variance (GEV; i.e., the percentage of total variance in the data explained by a given microstate) of an error-related microstate observed during the same -64 to 108 ms period (i.e., error-related microstate 3), and to greater anxiety risk as measured by parent-reported behavioral inhibition. During resting-state, six data-driven microstates were identified. Both greater magnitude of the ERN and greater GEV values of error-related microstate 3 associated with greater GEV values of resting-state microstate 4, which showed a frontal-central scalp topography. Source localization results revealed overlap between the underlying neural generators of error-related microstate 3 and resting-state microstate 4 and canonical brain networks (e.g., ventral attention) known to support the higher-order cognitive processes involved in error processing. Taken together, our results clarify how individual differences in error-related and intrinsic brain activity are related and enhance our understanding of developing brain network function and organization supporting error processing during early childhood.