Realization of InGaN laser diodes above 500 nm by growth optimization of the InGaN/GaN active region
Realization of InGaN laser diodes above 500 nm by growth optimization of the InGaN/GaN active region
复制标题
通过 InGaN/GaN 有源区的生长优化实现 500 nm 以上的 InGaN 激光二极管
DOI:
10.7567/apex.7.111001
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发表时间:
2014-11-01
影响因子:
2.3
通讯作者:
Yang, Hui
中科院分区:
文献类型:
--
作者:
Liu, Jianping;Li, Zengcheng;Yang, Hui
Two-step growth was employed to grow GaN quantum barriers (QBs) in InGaN green LD structures. A cap layer was grown at the same temperature as an InGaN quantum well (QW), and the temperature was then raised by around 130 degrees C to grow GaN QBs. The effects of low-temperature- grown cap (LT-cap) layers on the optical properties and microstructures of green LD structures were investigated. It was found that the LT-cap layer with an optimal thickness can improve the luminescence homogeneity and suppress the thermal decomposition of InGaN QWs. C-plane ridge waveguide laser diodes lasing above 500 nm were realized. (C) 2014 The Japan Society of Applied Physics