Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization.

Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization.
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DOI:
10.1107/s002188981301580x
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发表时间:
2013-08-01
影响因子:
6.1
通讯作者:
Gumbsch P
Gumbsch P
中科院分区:
材料科学3区
文献类型:
--
作者:
Syha M;Trenkle A;Lödermann B;Graff A;Ludwig W;Weygand D;Gumbsch P

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相应的二维晶粒图的衍射对比度断层扫描和电子背散射衍射表征方法进行了对齐和比较,专注于在内部接口的空间分辨率。所比较的晶界网络在形态学和晶体学取向上都显示出非常好的一致性。利用电子背散射衍射(EBSD)技术对多晶块状钛酸锶的衍射衬度层析数据进行了微结构重建研究。相应的二维晶粒图从两种表征方法进行了对齐和比较,集中在内部接口的空间分辨率。所比较的晶界网络在形态学和晶体学取向上都显示出非常好的一致性。在衍射数据重建和EBSD数据收集技术的背景下,严格评估和讨论的偏差。
Corresponding two-dimensional grain maps from the diffraction contrast tomography and electron backscatter diffraction characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation. Microstructure reconstructions resulting from diffraction contrast tomography data of polycrystalline bulk strontium titanate were reinvestigated by means of electron backscatter diffraction (EBSD) characterization. Corresponding two-dimensional grain maps from the two characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation. Deviations are critically assessed and discussed in the context of diffraction data reconstruction and EBSD data collection techniques.