Springer handbook of crystal growth
Springer handbook of crystal growth
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DOI：
10.1007/978-3-540-74761-1
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发表时间：
2010
期刊：
影响因子：
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通讯作者：
G. Dhanaraj;K. Byrappa;V. Prasad;M. Dudley
中科院分区：
文献类型：
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作者：
G. Dhanaraj;K. Byrappa;V. Prasad;M. Dudley
本文简要介绍了晶体生长技术和晶体分析表征方法。这是后续章节中关于生长现象基础、生长过程细节、缺陷类型、缺陷形成和分布机制以及建模和表征工具的细节的前奏，这些工具被用于研究生长晶体，并带来更高质量和大尺寸晶体的工艺改进。
A brief overview of crystal growth techniques and crystal analysis and characterization methods is presented here. This is a prelude to the details in subsequent chapters on fundamentals of growth phenomena, details of growth processes, types of defects, mechanisms of defect formation and distribution, and modeling and characterization tools that are being employed to study as-grown crystals and bring about process improvements for better-quality and large-size crystals.