Development of x-ray nanodiffraction instrumentation for studies of individual nano-objects
Development of x-ray nanodiffraction instrumentation for studies of individual nano-objects
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开发用于研究单个纳米物体的 X 射线纳米衍射仪器
DOI：
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发表时间：
2005
期刊：
影响因子：
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通讯作者：
B. Lai
中科院分区：
文献类型：
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作者：
Yanan Xiao;Z. Cai;B. Lai
X射线纳米衍射是为了在先进光子源（APS）上研究单个晶体纳米物体而开发的。该技术允许对单个纳米物体进行无损结构表征，具有高结构灵敏度和高穿透性的优点。利用第三代同步辐射光源的极高亮度和硬X射线相位波带片光学器件，我们在常规操作中将硬X射线聚焦到小于200 nm的微束，以便可以从单个氧化锡纳米线（横截面低至24 nm × 10 nm）测量显著的衍射。在本文中，我们将详细描述的实验技术，并提出了一些氧化锡纳米线的结构研究的结果。
X-ray nanodiffraction was developed to study individual crystalline nano-objects at the Advanced Photon Source (APS). This technique allows nondestructive structural characterization of individual nano-objects with the advantages of high structural sensitivity and high penetration. Using the extremely high brightness of a third-generation synchrotron radiation source and hard x-ray phase zone-plate optics, we have focused hard x-rays to a microbeam of less than 200 nm during routine operation so that significant diffraction can be measured from a single tin oxide nanowire (cross section down to 24 nm × 10 nm). In this paper, we will describe the experimental technique in detail and present the results of a structural study of a few tin oxide nanowires.