SCANNING LORENTZ ELECTRON-MICROSCOPE WITH HIGH-RESOLUTION AND OBSERVATION OF BIT PROFILES RECORDED ON SPUTTERED LONGITUDINAL MEDIA
SCANNING LORENTZ ELECTRON-MICROSCOPE WITH HIGH-RESOLUTION AND OBSERVATION OF BIT PROFILES RECORDED ON SPUTTERED LONGITUDINAL MEDIA
复制标题
DOI：
10.1063/1.353534
复制
发表时间：
1993-05-15
影响因子：
3.2
通讯作者：
SUGITA, Y
中科院分区：
文献类型：
--
作者：
YAJIMA, Y;TAKAHASHI, Y;SUGITA, Y
用冷场发射源操作的透射电子显微镜已被修改，以便于微分相衬映射和应用于观察微观磁记录纵向介质中出现的功能。在描述了扫描洛伦兹电子显微镜的设计和性能，因为我们称之为，结果描绘在钴基溅射纵向介质上的位模式的观察。所观察到的位剖面的宏观磁介质的性质和设备的性能的关系进行了讨论。然后，构成介质的磁性微晶的尺度上的磁化波动进行检查。还给出了一个帐户的杂散场效应固有的硬磁材料。
A transmission electron microscope operating with a cold field emission source has been modified to facilitate differential phase contrast mapping and applied to the observation of microscopic magnetic features appearing in recorded longitudinal media. After describing the design and performance of the scanning Lorentz electron microscope, as we call it, results on the observation of bit patterns delineated on Co-based sputtered longitudinal media are presented. Relations of observed bit profiles to macroscopic magnetic properties of media and to device performance are discussed. Then, magnetization fluctuation on a scale of magnetic crystallites constituting the medium is examined. Also given is an account of a stray field effect inherent in hard magnetic materials.