Introduction to Scanning Tunneling Microscopy
Introduction to Scanning Tunneling Microscopy
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DOI：
10.1119/1.17525
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发表时间：
1993-05
期刊：
影响因子：
--
通讯作者：
S. Edition;C. J. Chen
中科院分区：
文献类型：
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作者：
S. Edition;C. J. Chen
扫描隧道显微镜（STM）由Binnig和Rohrer发明，并于1986年获得诺贝尔物理学奖。与原子力显微镜（AFM）一起，它能够以皮米分辨率对固体表面上的原子和分子进行非破坏性观察和映射。最近的发展是对单个原子和分子的波函数进行非破坏性观察，包括波函数内部的节点结构。STM和AFM已成为物理学家、化学家、工程师和生物学家等各学科科学家观察和利用我们周围微观世界不可缺少的工具。自1993年第一版出版以来，这本书已被公认为开始使用扫描探针显微镜的每个人的标准介绍，以及该领域更先进的有用参考书。在介绍基本设计、科学背景和说明性应用的入门级新手可访问的概述章节之后，本书有三个部分。第一部分，原则，提供了最系统和详细的理论，其科学基础，从基本的量子力学和凝聚态物理在所有可用的文献。定量分析其原子，分子和波函数的成像机制进行了详细说明。第二部分，仪器，提供了脚踏实地的描述，其建筑组件，包括压电扫描仪，隔振，电子，软件，探针尖端准备等第三部分，相关的方法，提出了两个最重要的兄弟姐妹，扫描隧道光谱和原子力miscsoscopy。本书有五个背景主题附录，以及405个供进一步阅读的参考文献。
The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it enables non-destructive observing and mapping atoms and molecules on solid surfaces down to a picometer resolution. A recent development is the non-destructive observation of wavefunctions in individual atoms and molecules, including nodal structures inside the wavefunctions. STM and AFM have become indespensible instruments for scientists of various disciplines, including physicists, chemists, engineers, and biologists to visualize and utilize the microscopic world around us. Since the publication of the first edition in 1993, this book has been recognized as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field. After an Overview chapter accessible for newcomers at an entry level presenting the basic design, scientific background, and illustrative applications, the book has three Parts. Part I, Principles, provides the most systematic and detailed theory of its scientific bases from basic quantum mechancis and condensed-metter physics in all available literature. Quantitative analysis of its imaging mechanism for atoms, molecules, and wavefunctions is detailed. Part II, Instrumentation, provides down to earth descriptions of its building components, including piezoelectric scanners, vibration isolation, electronics, software, probe tip preparation, etc. Part III, Related methods, presenting two of its most important siblings, scanning tunnelling specgroscopy and atomic force miscsoscopy. The book has five appendices for background topics, and 405 references for further readings.