Flight x-ray CCD selection for the AXAF CCD Imaging Spectrometer
Flight x-ray CCD selection for the AXAF CCD Imaging Spectrometer
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AXAF CCD 成像光谱仪的飞行 X 射线 CCD 选择
DOI：
10.1117/12.255993
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发表时间：
1996
期刊：
影响因子：
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通讯作者：
J. A. Gregory
中科院分区：
文献类型：
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作者：
M. Pivovaroff;S. Kissel;M. Bautz;G. Prigozhin;T. Isobe;J. W. Woo;J. A. Gregory
作为我们为AXAF CCD成像光谱仪选择和校准飞行质量X射线CCD探测器计划的一部分，我们开发了有效的探测器筛选方法。我们的筛选协议，测量设备级的性能参数（包括噪声，暗电流和电荷转移效率），以及在0.3 - 6千电子伏波段的X射线光谱分辨率，使我们能够快速确定哪些大于30飞行候选探测器保证支出的严重有限的时间可用于校准。用于排名设备的性能标准进行了讨论，并提出了测量方法的细节。筛选测量的总结结果，提出了一个大样本的设备，并对选定的设备的详细数据进行了说明。我们发现，样本的飞行设备之间的性能变化是相对较小的，但显着的。
As part of our program to select and calibrate flight- quality, x-ray CCD detectors for the AXAF CCD imaging spectrometer, we have developed efficient detector screening methods. Our screening protocol, which measures device-level performance parameters (including noise, dark current and charge transfer efficiency) as well as x-ray spectral resolution in the 0.3 - 6 keV band, allows us quickly to identify which of the greater than 30 flight candidate detectors warrant the expenditure of severely limited time available for calibration. The performance criteria used to rank devices are discussed, and the details of the measurement methods are presented. Summary results of the screening measurements are presented for a large sample of devices, and detailed data on selected devices are described. We find that the performance variations among the sample of flight devices to be relatively small but significant.