The reliability of bypass diodes in PV modules
The reliability of bypass diodes in PV modules
复制标题
光伏组件中旁路二极管的可靠性
DOI：
10.1117/12.2026782
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发表时间：
2013
期刊：
影响因子：
--
通讯作者：
V. Gade
中科院分区：
文献类型：
--
作者：
N. Dhere;N. Shiradkar;E. Schneller;V. Gade
在现场部署的光伏组件中的旁路二极管的工作条件比二极管制造商测试二极管的条件苛刻得多。这有可能显著缩短旁路二极管的工作寿命，并引发了人们对光伏组件整体安全性和可靠性的担忧。对光伏组件中使用的旁路二极管的故障模式和机制的研究可以提供重要的信息，这些信息将有助于预测组件的寿命。本文综述了旁路二极管的失效模式和失效机理，以及目前与旁路二极管可靠性试验相关的工作。国际光伏组件质量保证工作组建议开展以下四个潜在领域的研究，以了解旁路二极管的可靠性问题：静电放电、反向偏置热失控测试、正向偏置过热以及正向偏置到反向偏置的过渡测试。作为佛罗里达州太阳能中心和捷普公司太阳能和环境测试实验室的联合努力，已经开始按照国际光伏组件质量保证工作组提供的指导方针对旁路二极管进行实验室测试。本文给出了这项工作的初步结果。
The operating conditions of bypass diodes in PV modules deployed in the field are considerably harsher than the conditions at which the diode manufacturers test the diodes. This has a potential to significantly reduce the operating life of bypass diodes and has raised concerns about the safety and reliability of PV modules as a whole. The study of modes and mechanisms of the failures encountered in bypass diodes used in PV modules can provide important information which would be useful to predict the module lifetime. This paper presents the review of the failure modes and mechanisms observed in bypass diodes and current work related to reliability testing of bypass diodes. The International PV Module Quality Assurance Task Force has recommended following four potential areas of research to understand the reliability issues of bypass diodes: Electrostatic Discharge, reverse bias thermal runaway testing, forward bias overheating and transition testing of forward bias to reverse bias. As a joint collaborative effort between Florida Solar Energy Center and Solar and Environmental Test Laboratory at Jabil Inc., laboratory testing of bypass diodes on the guidelines provided by the International PV Module Quality Assurance Task Force has been initiated. Preliminary results from this work are presented in this paper.