Fabrication and critical current properties in Nd:YAG-PLD REBa2Cu3Oy (RE= Y and Er) thin films
Fabrication and critical current properties in Nd:YAG-PLD REBa2Cu3Oy (RE= Y and Er) thin films
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Nd:YAG-PLD REBa2Cu3Oy(RE= Y 和 Er)薄膜的制备和临界电流特性
DOI:
10.1016/j.phpro.2012.03.450
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发表时间:
2012
期刊:
影响因子:
--
通讯作者:
M. Haruta
中科院分区:
文献类型:
--
作者:
S. Horii;N. Fujita;Y. Ogura;T. Maeda;M. Haruta
We report optimization of substrate temperature (Ts) regions for achievement of the bi-axially oriented growth without the a-axis oriented domains, critical current properties and crystallinities in REBa2Cu3Oy (RE123) films (RE= Y and Er) grown by pulsed laser deposition using a Nd:YAG laser. Appropriate Ts regions for achieving both high critical temperature and self-field critical current density in Y123 and Er123 films were found to be similar. In the case of Y123, infield critical current densities and inplane lattice parameters for the Y123 films grown in a lower Ts region were slightly changed compared with those for the films grown at a higher Ts region. Our findings in the present study give us fundamental information to understand intrinsic effects of introduction of nanorods in the RE123 films containing nanorods.