Fabrication and critical current properties in Nd:YAG-PLD REBa2Cu3Oy (RE= Y and Er) thin films

Fabrication and critical current properties in Nd:YAG-PLD REBa2Cu3Oy (RE= Y and Er) thin films
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Nd:YAG-PLD REBa2Cu3Oy(RE= Y 和 Er)薄膜的制备和临界电流特性

DOI:
10.1016/j.phpro.2012.03.450
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发表时间:
2012
期刊:
Physics Procedia
影响因子:
--
通讯作者:
M. Haruta
M. Haruta
中科院分区:
--
文献类型:
--
作者:
S. Horii;N. Fujita;Y. Ogura;T. Maeda;M. Haruta

文献摘要

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本文报道了用脉冲激光沉积的REBa2Cu3Oy(RE123)薄膜(RE=Y和Er)中实现无a轴取向的双向生长的衬底温度(Ts)区的优化、临界电流特性和结晶度。在Y123和Er123薄膜中,获得高临界温度和自场临界电流密度的合适的ts区是相似的。在Y123的情况下,生长在较低ts区的Y123薄膜的内场临界电流密度和面内晶格参数与生长在较高ts区的Y123膜相比略有变化。我们在本研究中的发现为我们理解在含有纳米棒的RE123薄膜中引入纳米棒的本征效应提供了基础信息。
We report optimization of substrate temperature (Ts) regions for achievement of the bi-axially oriented growth without the a-axis oriented domains, critical current properties and crystallinities in REBa2Cu3Oy (RE123) films (RE= Y and Er) grown by pulsed laser deposition using a Nd:YAG laser. Appropriate Ts regions for achieving both high critical temperature and self-field critical current density in Y123 and Er123 films were found to be similar. In the case of Y123, infield critical current densities and inplane lattice parameters for the Y123 films grown in a lower Ts region were slightly changed compared with those for the films grown at a higher Ts region. Our findings in the present study give us fundamental information to understand intrinsic effects of introduction of nanorods in the RE123 films containing nanorods.