Multifrequency ESR Characterization of Paramagnetic Point Defects in Semiconducting Cubic BN Crystals
Multifrequency ESR Characterization of Paramagnetic Point Defects in Semiconducting Cubic BN Crystals
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半导体立方 BN 晶体顺磁点缺陷的多频 ESR 表征
DOI：
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发表时间：
2010
期刊：
影响因子：
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通讯作者：
E. Goovaerts
中科院分区：
文献类型：
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作者：
S. Nistor;M. Stefan;D. Ghica;E. Goovaerts
低频（x波段）电子自旋共振（ESR）研究了市售的不同颜色的大晶粒立方氮化硼（cBN）超磨料粉末，结合高频（w波段）ESR测量了从相同粉末样品中选择的定向亚毫米大小的单晶，结果清楚地识别了几种类型的顺磁点缺陷。本文报道了琥珀色cBN样品在3-293 K温度范围内的自旋哈密顿参数和顺磁缺陷的光敏性。结果表明，顺磁中心的性质取决于所研究样品的颜色，并且在许多情况下，不受控制的杂质似乎与它们的结构有关。
Low-frequency (X-band) electron spin resonance (ESR) investigations on commercially available large-grained cubic boron nitride (cBN) superabrasive powders of various coloration, combined with high-frequency (W-band) ESR measurements on oriented submillimeter-size single crystallites selected from the same powder samples, resulted in a clear identification of several types of paramagnetic point defects. The resulting spin Hamiltonian parameters describing the ESR spectra observed in the 3–293 K temperature range and the photosensitivity of the paramagnetic defects observed in amber-colored cBN samples are reported. It is shown that the nature of the paramagnetic centers depends on the color of the investigated samples and that, in many cases, uncontrolled impurities seem to be involved in their structure.