Microstructures of Co/Cr Bilayer Films Epitaxially Grown on MgO Single-Crystal Substrates

Microstructures of Co/Cr Bilayer Films Epitaxially Grown on MgO Single-Crystal Substrates
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MgO单晶衬底上外延生长的Co/Cr双层薄膜的微观结构

DOI：
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发表时间：
1995
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影响因子：
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通讯作者：
Masaaki Futamoto Masaaki Futamoto
Masaaki Futamoto Masaaki Futamoto
中科院分区：
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作者：
A. Nakamura;M. Koguchi;Masaaki Futamoto Masaaki Futamoto

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用高分辨电子显微镜研究了在(100)和(110)单晶衬底上外延生长的Co/Cr双层膜的微结构。在(100)衬底上形成的双晶Co层含有大量的(0001)层错。在MgO(110)衬底上形成的单晶Co层由在(211)取向的Cr域上生长的略微取向错误的亚晶组成。在Cr/MgO(110)界面上观察到位错和晶格应变。晶格错位和缺陷的引入被认为是为了适应在Cr/̄(10)界面处沿MgO[1]方向约-16%的大的晶格失配。
Microstructures of Co/Cr bilayer films epitaxially grown on MgO (100) and (110) single-crystal substrates have been studied by high-resolution transmission electron microscopy. The bicrystalline Co layer formed on the MgO (100) substrate contains a number of (0001) stacking faults. The single-crystal Co layer formed on the MgO (110) substrate consists of slightly misoriented subgrains, grown on (211)-oriented Cr domains. Dislocations and lattice strain are observed at the Cr/MgO (110) interface. The misorientations and the defects are thought to be introduced to accommodate the large lattice mismatch of about -16% in the MgO [1̄10] direction at the Cr/MgO (110) interface.