Searching for sub-MeV boosted dark matter from xenon electron direct detection *
Searching for sub-MeV boosted dark matter from xenon electron direct detection *
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DOI：
10.1088/1674-1137/abe195
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发表时间：
2020-06
影响因子：
3.6
通讯作者：
Q. Cao;Ran Ding;Qian-Fei Xiang
中科院分区：
文献类型：
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作者：
Q. Cao;Ran Ding;Qian-Fei Xiang
直接探测实验由于反冲能量的阈值而失去了寻找亚MeV轻暗物质候选者的灵敏度。然而，这种轻暗物质粒子可以被高能宇宙射线加速，这样它们就可以被现有的探测器探测到。我们从XENON 100/1 T实验中导出了增强光暗物质和电子散射的约束条件。我们说明，能量依赖的横截面起着至关重要的作用，在提高检测灵敏度和直接检测和其他实验的互补性。
Direct detection experiments turn to lose sensitivity of searching for a sub-MeV light dark matter candidate due to the threshold of recoil energy. However, such light dark matter particles can be accelerated by energetic cosmic-rays such that they can be detected with existing detectors. We derive the constraints on the scattering of a boosted light dark matter and electron from the XENON100/1T experiment. We illustrate that the energy dependence of the cross section plays a crucial role in improving both the detection sensitivity and also the complementarity of direct detection and other experiments.