Low-Power BIST With a Smoother and Scan-Chain Reorder Under Optimal Cluster Size
Low-Power BIST With a Smoother and Scan-Chain Reorder Under Optimal Cluster Size
复制标题
DOI：
10.1109/tcad.2006.870861
复制
发表时间：
2006-11
影响因子：
2.9
通讯作者：
Nan-Cheng Lai;Sying-Jyan Wang;Yu-Hsuan Fu
中科院分区：
文献类型：
--
作者：
Nan-Cheng Lai;Sying-Jyan Wang;Yu-Hsuan Fu
针对基于扫描的内建自测试，提出了一种低功耗测试方法。该方法将低功耗测试模式产生器(TPG)与扫描链重新排序相结合，在不丢失故障覆盖的情况下实现低功耗测试。主要解决了三个问题。首先，在TPG中加入了更平滑的组件，以降低平均功耗。然而，更平滑的扫描链可能会对错误覆盖造成不利影响；因此，采用了基于簇的扫描链重新排序来解决这个问题。如果有必要大幅降低功率，则故障覆盖率会显著下降。这可以通过重新播种来解决。本文的第二个主题是对最小化扫描链长度的最佳簇大小进行详细的分析。最后，为了提高故障覆盖率，提出了一种快速高效的扫描链重排序算法。重排序算法在计算时间方面非常高效，重排序扫描链的布线长度与商业工具给出的结果相当或更小。实验结果表明，在测试长度相同的情况下，该方法显著且一致地降低了平均测试功耗，并且故障覆盖率与以前的方法相似
The authors propose a low-power testing methodology for the scan-based built-in self-test. This approach combines a low-power test pattern generator (TPG) with scan-chain reordering to achieve low-power testing without losing fault coverage. Three main issues are addressed. First, a smoother is included in the TPG to reduce the average power consumption. However, the fault coverage may be adversely affected by the smoother; hence, a cluster-based scan-chain reordering is employed to remedy this problem. If a very-large power reduction is necessary, the fault-coverage drop can become significant. This can be addressed by reseeding. The second topic of this paper is to give a detailed analysis on the optimal cluster size to minimize the scan-chain length. Finally, a fast and efficient algorithm is developed for scan-chain reorder in order to improve the fault coverage. The reordering algorithm is very efficient in terms of computation time, and the routing length of the reordered scan chain is comparable to or smaller than the result given by commercial tools. Experimental results show that the proposed method provides a significant and consistent reduction in the average test power, and the fault coverage is similar to previous methods with the same test lengths