A Reconfigurable Transient Optimizer Applied to a Four-Phase Buck Converter for Optimizing Both DVS and Load Transient Responses
A Reconfigurable Transient Optimizer Applied to a Four-Phase Buck Converter for Optimizing Both DVS and Load Transient Responses
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应用于四相降压转换器的可重构瞬态优化器，用于优化 DVS 和负载瞬态响应
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发表时间：
2020
期刊：
影响因子：
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通讯作者：
T. Kuo
中科院分区：
文献类型：
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作者：
Pai;Yi;T. Kuo
本摘要提出了可重新配置的瞬态优化器（RTO），应用于四相降压转换器，以优化动态电压尺度（DVS）和负载瞬态响应，以接近理论最小输出电机的下线效果下线<inline-formula> <inline-formula>数学符号=“ latex”> $ {\ delta} \ text {v} _ {\ mathrm {us}} $ </tex-math> </tex-math> </inline-formula>，edline-formula> =“ latex”> $ {\ delta } \ text {v} _ {\ mathrm {os}} $ </tex-math> </inline-formula>和设置时间<inline-formula> <tex-math notegy =“ latex”> $ \ text { T} _ {\ Mathrm {s}} $ </tex-Math> </inline-formula>分别通过电压传感器和校准电容器 - 电流传感器立即检测到DVS。负载瞬态发生，RTO启用了所有四个阶段，重新配置其电路体系结构，并控制电源开关的最佳时间，从而将输出电压设置为单个On-Off开关中使用<inline-formula> <tex-math notegy =“ latex”> $ {\ delta} \ text {v {v } _ {\ mathrm {us}} $ </tex-math> </inline-formula>，<inline-formula> <tex-math notegy =“ latex”> $ {\ delta} \ text \ text {v} _ { \ Mathrm {OS}} $ </tex-Math> </inline-formula>和<inline-formula> <tex-math notage =“ latex”> $ \ text {t} _ {\ mathrm {s}} $ </tex-math> </inline-formula>靠近其各自的理论最小值。 -formula> <tex-math notegy =“ latex”> $ {\ mu} \ text {m} $ </tex-math> </inline-formula> cmos> 2.3毫米<sup> 2 </sup </sup >芯片区域。 notage =“ latex”> $ {\ delta} \ text {v} _ {\ mathrm {os}} $ </tex-math> </inline-formula>（<inline-formula> <tex-math notegy ='乳胶“> $ {\ delta} \ text {v} _ {\ mathrm {us}} $ </tex-math> </inline-formula>）是无法观察到的，而测得的<inline-formula> <tex-数学符号=“乳胶”> $ \ text {t} _ {\ mathrm {s}} $ </tex-math> </inline-formula>是182 ns（192 ns）。 （降压）负载瞬态，测量<inline-formula> <tex-math notegy =“ latex”> $ {\ delta} \ text {v} _ {\ mathrm {us}} $ </tex-math> </tex-math> </inline-inline-formula >（<inline-formula> <tex-math notegy =“ latex”> $ {\ delta} \ text {v} _ {\ mathrm {os}}} $ </tex-math> </inline-formula>）和<inline-formula> <tex-math notegy =“ latex”> $ \ text {t} _ {\ mathrm {s}} $ </tex-math> </inline-formula>是56 mV（45 mv）和85 NS（76 ns），与其他最先进的作品相比，此简介的<inline-formula> <tex-math notegy =“ latex”> $ \ text {t} _ {\ mathrm {s s}} $ </ DVS瞬态响应中的Tex-Math> </inline-formula>是最接近其理论最小值，而<inline-formula> <tex-math notegy =“ latex”> $ {\ delta} \ text { v} _ {\ mathrm {us}} $ </tex-math> </inline-formula>，<inline-formula> <tex-math notage =“ latex”> $ {\ delta} \ text {v} _ {\ mathrm {os}} $ </tex-math> </tex-math> </inline-formula>和<inline-formula> <tex-mathnotegnoge = “ latex”> $ \ text {t} _ {\ mathrm {s}} $ </tex-math> </tex-math> </inline-formula>在负载瞬态响应中的各自的理论最小值是可比的。
This brief presents a reconfigurable transient optimizer (RTO) applied to a four-phase buck converter for optimizing both dynamic-voltage-scaling (DVS) and load transient responses to approach the theoretically minimum output-voltage undershoot <inline-formula> <tex-math notation="LaTeX">${ \Delta }\text{V}_{\mathrm{US}}$ </tex-math></inline-formula>, overshoot <inline-formula> <tex-math notation="LaTeX">${ \Delta }\text{V}_{\mathrm{OS}}$ </tex-math></inline-formula>, and settling time <inline-formula> <tex-math notation="LaTeX">$\text{t}_{\mathrm{S}}$ </tex-math></inline-formula>. The DVS and load transients are instantly detected by a voltage sensor and calibrated capacitor-current sensor, respectively. When a large DVS or load transient occurs, the RTO enables all four phases, reconfigures its circuit architecture, and controls the optimal ON–OFF times of the power switches, thereby settling the output voltage in a single ON–OFF switching with <inline-formula> <tex-math notation="LaTeX">${ \Delta }\text{V}_{\mathrm{US}}$ </tex-math></inline-formula>, <inline-formula> <tex-math notation="LaTeX">${ \Delta }\text{V}_{\mathrm{OS}}$ </tex-math></inline-formula>, and <inline-formula> <tex-math notation="LaTeX">$\text{t}_{\mathrm{S}}$ </tex-math></inline-formula> close to their respective theoretical minima. The converter is fabricated in a 0.18-<inline-formula> <tex-math notation="LaTeX">$ {\mu }\text{m}$ </tex-math></inline-formula> CMOS process with a 2.3-mm<sup>2</sup> chip area. For a 1-to-1.8 V (1.8-to-1 V) DVS transient, the measured <inline-formula> <tex-math notation="LaTeX">${ \Delta }\text{V}_{\mathrm{OS}}$ </tex-math></inline-formula> (<inline-formula> <tex-math notation="LaTeX">${ \Delta }\text{V}_{\mathrm{US}}$ </tex-math></inline-formula>) is not observable, while the measured <inline-formula> <tex-math notation="LaTeX">$\text{t}_{\mathrm{S}}$ </tex-math></inline-formula> is 182 ns (192 ns). For a 1.8-A step-up (step-down) load transient, the measured <inline-formula> <tex-math notation="LaTeX">${ \Delta }\text{V}_{\mathrm{US}}$ </tex-math></inline-formula> (<inline-formula> <tex-math notation="LaTeX">${ \Delta }\text{V}_{\mathrm{OS}}$ </tex-math></inline-formula>) and <inline-formula> <tex-math notation="LaTeX">$\text{t}_{\mathrm{S}}$ </tex-math></inline-formula> are 56 mV (45 mV) and 85 ns (76 ns), respectively. Compared with other state-of-the-arts, this brief’s <inline-formula> <tex-math notation="LaTeX">$\text{t}_{\mathrm{S}}$ </tex-math></inline-formula> in the DVS transient response is the closest to its theoretical minimum, while the ratios of <inline-formula> <tex-math notation="LaTeX">${ \Delta }\text{V}_{\mathrm{US}}$ </tex-math></inline-formula>, <inline-formula> <tex-math notation="LaTeX">${ \Delta }\text{V}_{\mathrm{OS}}$ </tex-math></inline-formula>, and <inline-formula> <tex-math notation="LaTeX">$\text{t}_{\mathrm{S}}$ </tex-math></inline-formula> to their respective theoretical minima in the load transient response are comparable.