Direct Measurements of the Ionization Potential Depression in a Dense Plasma
Direct Measurements of the Ionization Potential Depression in a Dense Plasma
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DOI：
10.1103/physrevlett.109.065002
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发表时间：
2012-08-06
影响因子：
8.6
通讯作者：
Wark, J. S.
中科院分区：
文献类型：
--
作者：
Ciricosta, O.;Vinko, S. M.;Wark, J. S.
我们使用直线加速器相干光源在高达 180 eV 的温度下产生固体密度铝等离子体。通过改变产生和探测等离子体的 X 射线的光子能量，并观察 K-α 荧光，我们可以直接测量系统内高电荷离子的 K 边缘的位置。结果发现与广泛使用的斯图尔特-皮亚特模型的预测不一致，但与埃克和克罗尔的早期模型一致，该模型预测电离势的显着更大的降低。
We have used the Linac Coherent Light Source to generate solid-density aluminum plasmas at temperatures of up to 180 eV. By varying the photon energy of the x rays that both create and probe the plasma, and observing the K-alpha fluorescence, we can directly measure the position of the K edge of the highly charged ions within the system. The results are found to disagree with the predictions of the extensively used Stewart-Pyatt model, but are consistent with the earlier model of Ecker and Kroll, which predicts significantly greater depression of the ionization potential.