Direct Analysis of Atomic Structures of Advanced Ceramics by High-Resolution Electron Microscopy
Direct Analysis of Atomic Structures of Advanced Ceramics by High-Resolution Electron Microscopy
复制标题
通过高分辨率电子显微镜直接分析先进陶瓷的原子结构
DOI：
10.2109/jcersj.109.1266_s17
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发表时间：
2001
影响因子：
1.1
通讯作者：
T. Oku
中科院分区：
文献类型：
--
作者：
T. Oku
先进的新型陶瓷材料有望成为新能源和信息材料，解决能源和信息问题的装置。这些新材料的特性将在很大程度上取决于原子排列，而 HREM 将有助于对其进行直接原子分析。除了这种直接原子观察之外，最近随着电子枪的进步，纳米电子衍射、电子能量损失光谱（EELS）、能量色散X射线光谱（EDX）和电子全息术等方法的信息也被结合起来。很快就能阐明这些先进材料中纳米区域的原子排列、成分、电子态和磁性结构。
Advanced new ceramic materials are expected to be available for use as new energy and information materials, on which devices for solving energy and information problems will be based. The properties of these new materials will be strongly dependent on the atomic arrangements, the direct atomic analysis of which will have been contributed to by HREM. In addition to such direct atomic observation, information from such methods as nano-electron diffraction, electron energy-loss spectroscopy (EELS), energy dispersive X-ray spectroscopy (EDX) and electron holography has being combined recently by progress with the electron gun. It will soon be possible to clarify atomic arrangement, composition, electronic state and magnetic structure of the nano-regions in these advanced materials.