Dirac-node arc in the topological line-node semimetal HfSiS
Dirac-node arc in the topological line-node semimetal HfSiS
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DOI：
10.1103/physrevb.94.121108
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发表时间：
2016-09-08
影响因子：
3.7
通讯作者：
Ando, Yoichi
中科院分区：
文献类型：
--
作者：
Takane, D.;Wang, Zhiwei;Ando, Yoichi
我们已经进行了角分辨光电子能谱HfSiS，这已被预测为一个拓扑线节点半金属与正方形Si晶格。我们发现了一个准二维费米表面托管散装节线，旁边的布里渊区角落的表面状态表现出相当大的Rashba分裂和带质量重整化由于多体相互作用。最值得注意的是，我们发现了一个意想不到的Dirac分散体扩展一维k空间的Dirac节点弧附近的散装节点在区域对角线。这些新的狄拉克态位于表面，可能与体态的杂化有关，但目前我们还没有解释其起源。这一发现对拓扑线结半金属的理论理解提出了一个有趣的挑战。
We have performed angle-resolved photoemission spectroscopy on HfSiS, which has been predicted to be a topological line-node semimetal with square Si lattice. We found a quasi-two-dimensional Fermi surface hosting bulk nodal lines, alongside the surface states at the Brillouin-zone corner exhibiting a sizable Rashba splitting and band-mass renormalization due to many-body interactions. Most notably, we discovered an unexpected Dirac-like dispersion extending one dimensionally in k space-the Dirac-node arc-near the bulk node at the zone diagonal. These novel Dirac states reside on the surface and could be related to hybridizations of bulk states, but currently we have no explanation for its origin. This discovery poses an intriguing challenge to the theoretical understanding of topological line-node semimetals.