Non-spectroscopic refractometric nanosensor based on a tilted slit-groove plasmonic interferometer
Non-spectroscopic refractometric nanosensor based on a tilted slit-groove plasmonic interferometer
复制标题
基于倾斜狭缝槽等离子体干涉仪的非光谱折射纳米传感器
DOI：
10.1364/oe.19.020691
复制
发表时间：
2011-10-10
期刊：
影响因子：
3.8
通讯作者：
Jin, Guofan
中科院分区：
文献类型：
--
作者：
Li, Xiaowei;Tan, Qiaofeng;Jin, Guofan
等离子体纳米传感器在基于芯片的折射率检测方面很有前途，其中大部分是基于表面等离子体共振的光谱监测。在这里，我们提出了一种简单的基于等离子体干涉仪的非光谱折射率传感方案，该干涉仪集成了金属槽阵列和倾斜的纳米灯。由于纳米光的直接透射光和沟槽阵列发射的表面等离子体激元的干涉，在单色光的照射下可以探测到高对比度的条纹。通过检测干涉条纹的空间位移，可以得到覆盖分析物的折射率变化。在我们的实验中，该干涉仪的灵敏度高达5×10(3)微米/微米/平方英寸，品质因数高达250。这种传感器由于其简单、坚固和非光谱方案，在低成本、便携和高通量传感应用方面显示出巨大的潜力。(C)2011年美国光学学会
Plasmonic nanosensors are promising for chip-based refractometric detections, most of which are based on spectroscopic monitoring of surface plasmon resonance. Here, we propose a simple non-spectroscopic refractometric sensing scheme based on a plasmonic interferometer integrating a metallic groove array and a tilted nanoslit. Owing to the interference of the directly transmitted light from the nanoslit and that mediated by the surface plasmon polaritons launched from the groove array, high-contrast intensity fringe can be detected under the illumination of monochromatic light. By inspecting the spatial shift of the interference fringe, the refractive index change of the cover analyte can be derived. In our experiment, the interferometer shows a sensitivity up to 5 x 10(3) mu m/RIU and a figure of merit as high as 250. This sensor shows great potential for low-cost, portable, and high-throughput sensing applications due to its simple, robust, and non-spectroscopic scheme. (C)2011 Optical Society of America