Magnetostriction Of Tb-fe(B) Thin Films Fabricated By RF Magnetron Sputtering
Magnetostriction Of Tb-fe(B) Thin Films Fabricated By RF Magnetron Sputtering
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DOI:
10.1109/20.619622
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发表时间:
1997-04
期刊:
影响因子:
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通讯作者:
S. Lim;Y. Choi;S.H. Han;S.R. Lee;H. Kim;T. Shima;H. Fujimori
中科院分区:
文献类型:
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作者:
S. Lim;Y. Choi;S.H. Han;S.R. Lee;H. Kim;T. Shima;H. Fujimori
The magnetostriction of TbFe and TbFeB thin films is systematically investigated over a wide composition range from 40.2 to 68.1 at.% Tb for the B-free alloys and from 44.1 to 66.8 at.% Tb for the B containing thin films. The films were fabricated by rf magnetron sputtering. The microstructure mainly consists of an amorphous phase at low Tb contents and, at high Tb contents, a mixture of an amorphous phase and an /spl alpha/ Tb phase. Excellent magnetostrictive characteristics, particularly at low magnetic fields, are achieved in both TbFe and TbFeB thin films; for example, a magnetostriction of 138 ppm is obtained in a TbFeB thin film at a magnetic field as low as 30 Oe. These excellent magnetostrictive properties of the present thin films are supported by the excellent magnetic softness, the coercivity below 10 Oe and a typical squared-loop shape with the saturation field as low as 1 kOe. It is considered that, due to the excellent low field magnetostrictive characteristics, the present TbFe based magnetostrictive thin films are suitable for Si based microdevices.