Volumetric segmentation using Weibull E-SD fields
Volumetric segmentation using Weibull E-SD fields
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DOI:
10.1109/tvcg.2003.1207440
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发表时间:
2003-07-01
影响因子:
5.2
通讯作者:
Capco, DG
中科院分区:
文献类型:
--
作者:
Hu, JX;Razdan, A;Capco, DG
This paper presents a coarse-grain approach for segmentation of objects with gray levels appearing in volume data. The input data is on a 3D structured grid of vertices v(i, j, k), each associated with a scalar value. In this paper, we consider a voxel as a kappa x kappa x kappa, cube and each voxel is assigned two values: expectancy and standard deviation (E-SD). We use the Weibull noise index to estimate the noise in a voxel and to obtain more precise E-SD values for each voxel. We plot the frequency of voxels which have the same E-SD, then 3D segmentation based on the Weibull E-SD field is presented. Our test bed includes synthetic data as well as real volume data from a confocal laser scanning microscope (CLSM). Analysis of these data all show distinct and defining regions in their E-SD fields. Under the guide of the E-SD field, we can efficiently segment the objects embedded in real and simulated 3D data.