High-resolution imaging of organic monolayers using noncontact AFM
High-resolution imaging of organic monolayers using noncontact AFM
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使用非接触式 AFM 对有机单层进行高分辨率成像
DOI:
10.1016/s0169-4332(99)00534-6
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发表时间:
2000
影响因子:
6.7
通讯作者:
M. Ishikawa
中科院分区:
文献类型:
--
作者:
T. Uchihashi;T. Ishida;M. Komiyama;M. Ashino;Y. Sugawara;W. Mizutani;K. Yokoyama;S. Morita;H. Tokumoto;M. Ishikawa
Noncontact atomic force microscopy (AFM) provides useful technique for imaging organic molecules in high resolution. Here we present our recent advances in the noncontact AFM imaging of organic materials. (I) Molecular packing structures, defects and domain boundaries were clearly observed on adenine and thymine films. The noncontact AFM images revealed detailed features of the individual nucleic acid base molecules, thus allowing us to distinguish between adenine and thymine. (II) Both (√3×√3)R30° structures and c(4×2) superlattice structures were resolved on alkanethiolate self-assembled monolayer (SAM) [CH3(CH2)8SH] (nonanethiol) on Au(111). We found that the c(4×2) superlattice structures changed into (√3×√3)R30° structures when the tip–surface distance decreased.