Plasmon-cyclotron resonance in two-dimensional electron gas confined at the GaN/Al x Ga 1-x N interface
Plasmon-cyclotron resonance in two-dimensional electron gas confined at the GaN/Al x Ga 1-x N interface
复制标题
受限于 GaN/Al x Ga 1-x N 界面的二维电子气中的等离激元回旋共振
DOI：
10.1103/physrevb.76.045301
复制
发表时间：
2007
影响因子：
3.7
通讯作者：
C. Skierbiszewski
中科院分区：
文献类型：
--
作者：
A. Wołoś;W. Jantsch;K. Dybko;Z. Wilamowski;C. Skierbiszewski
本文用标准微波共振谱研究了限制在界面上的二维电子气的边缘磁等离子体模。共振线的位置和形状由等离子体-回旋耦合理论和动量弛豫的Drude模型描述。共振线形状的分析为确定二维电子气的面电子浓度和迁移率提供了一种非接触的方法。此外，我们观察Shubnikov-de哈斯振荡使用相同的微波共振光谱。我们比较的回旋和量子迁移率从等离子体回旋线宽和磁场依赖的舒布尼科夫-德哈斯信号，分别获得的值。
Edge magnetoplasma modes are studied in the two-dimensional electron gas confined at theinterface using standard microwave resonance spectroscopy. The position and shape of the resonance line are described by the theory for the dimension-dependent plasmon-cyclotron coupling and the Drude model of momentum relaxation. The analysis of the resonance line shape provides a contactless method for the determination of the sheet electron concentration and the mobility of the two-dimensional electron gas. In addition, we observe Shubnikov–de Haas oscillations using the same microwave resonance spectrometry. We compare values for the cyclotron and quantum mobilities obtained from the plasmon-cyclotron linewidth and the magnetic field dependence of the Shubnikov–de Haas signal, respectively.