Imaging by muons and their induced secondary particles—a novel technique

Imaging by muons and their induced secondary particles—a novel technique
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DOI:
10.1088/1748-0221/15/06/c06014
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发表时间:
2020-01
影响因子:
1.3
通讯作者:
G. Galgóczi;D. Mrdja;I. Bikit;K. Bikit;J. Slivka;Jan Hansman;L. Ol'ah;G. Hamar;D. Varga
G. Galgóczi;D. Mrdja;I. Bikit;K. Bikit;J. Slivka;Jan Hansman;L. Ol'ah;G. Hamar;D. Varga
中科院分区:
工程技术4区
文献类型:
--
作者:
G. Galgóczi;D. Mrdja;I. Bikit;K. Bikit;J. Slivka;Jan Hansman;L. Ol'ah;G. Hamar;D. Varga

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MUGRAPH是一种成熟的方法,可以利用宇宙缪子的存在,在没有任何额外粒子源的情况下获得大型物体(如火山和大型建筑物)的3D图像。互变成像的基本原理是测量单个µ子的轨迹,并确定它们的吸收或散射。这些过程取决于它们所经过的材料。所讨论的新方法是基于对被调查目标中的Muon轨迹和由Muon本身产生的相应粒子的测量。当缪子穿过物质时,它们通过电离、韧致辐射、成对生产和核相互作用与物质相互作用。我们的实验装置是以一种方式来测量初级介子和产生的次级介子(主要是电子和伽马)。Muon的轨迹是由一种特殊的多丝正比室(MWPC)确定的,这种室被称为闭合阴极室(CCC)。在靶子周围放置的四个塑料闪烁体测量了靶子中产生的次级粒子。CCC室和闪烁体的使用是巧合的,目的是收集穿过目标的介子的数据。由于所描述的过程的横截面随材料的密度和原子序数的不同而不同,该技术可用于研究靶材的材料含量。
Muography is a well established method to obtain 3D images of large objects (e.g. volcanoes and large buildings) without any additional particle source, taking advantage of the presence of cosmic muons. The underlying principle of muography is the measurement of individual muon tracks and the determination of their absorption or scattering. These processes depend on the material that they have travelled through. The novel method discussed is based on the measurement of the muon tracks and of the corresponding particles that were produced by the muons themselves in the investigated target. As muons pass through matter they interact with matter by ionization, bremsstrahlung, pair production and nuclear interactions. Our experimental setup is designed in a way to measure both the primary muons and the created secondaries (mostly electrons and gammas). The tracks of the muons are determined by a special kind of Multi-Wire Proportional Chambers (MWPC) called CCC (Close Cathode Chamber). The secondary particles produced in the target are measured by four plastic scintillators placed around the target. The CCC chambers and the scintillators are used in coincidence in order to gather data about muons that passed through the target. As cross sections of the described processes vary by the density and the atomic number of materials this technique could be used to investigate the material content of the target.