Phase dependence of the Josephson current in inhomogeneous high-Tc grain-boundary junctions
Phase dependence of the Josephson current in inhomogeneous high-Tc grain-boundary junctions
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DOI:
10.1103/physrevb.59.11502
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发表时间:
1999-05-01
影响因子:
3.7
通讯作者:
Müller, P
中科院分区:
文献类型:
--
作者:
Il'ichev, E;Zakosarenko, V;Müller, P
We present an experimental and theoretical study of the current-phase relation I-s(phi) for 45 degrees grain boundaries in YBa2Cu3O7-x films. A model of strongly inhomogeneous Josephson junctions, in which the presence of randomly alternating current leads to a deviation of I-s(phi) from the well-known sin(phi) dependence, has been used. This deviation decreases with the temperature T and is described by the formula I-s(phi) = I-c(T)(sin phi + gamma(T)sin2 phi). Using the developed model, the coefficient gamma is calculated and its temperature dependence is found to be in good agreement with experiment. [S0163-1829(99)01417-4].