Determination of Mode I and II Adhesion Toughness of Monolayer Thin Films by Circular Blister Tests

Determination of Mode I and II Adhesion Toughness of Monolayer Thin Films by Circular Blister Tests
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DOI:
10.1016/j.tafmec.2018.01.006
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发表时间:
2018-06
影响因子:
5.3
通讯作者:
C. Harvey;Simon Wang;Bo Yuan;R. Thomson;G. Critchlow
C. Harvey;Simon Wang;Bo Yuan;R. Thomson;G. Critchlow
中科院分区:
工程技术2区
文献类型:
--
作者:
C. Harvey;Simon Wang;Bo Yuan;R. Thomson;G. Critchlow

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