Ion trajectories in the field-ion microscope
Ion trajectories in the field-ion microscope
复制标题
场离子显微镜中的离子轨迹
DOI：
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发表时间：
1978
期刊：
影响因子：
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通讯作者：
J. Walls
中科院分区：
文献类型：
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作者：
Roger Smith;J. Walls
场离子显微镜中成像离子的轨迹已确定为双曲面和抛物面发射器形状。轨迹的形状已被证明与发射器和显微镜屏幕之间的电势差以及离子的荷质比无关。人们还发现，它随着笔尖到屏幕的距离和鼻子曲率的变化很小。发现球极投影与计算结果非常吻合。
The trajectories of the imaging ions in the field-ion microscope have been determined for hyperboloidal and paraboloidal emitter shapes. The shape of the trajectories has been shown to be independent of the potential difference between the emitter and the microscope screen and the charge-to-mass ratio of the ion. It has also been found to vary little with tip-to-screen distance and nose curvature. The stereographic projection is found to be in good agreement with the calculated results.