Diagnostics for ultrashort X-ray pulses using silicon trackers
Diagnostics for ultrashort X-ray pulses using silicon trackers
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DOI：
10.1016/j.nima.2021.165754
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发表时间：
2021-05
期刊：
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通讯作者：
Jiaxing Wen;Ming-hai Yu;Yuchi Wu;M. Zeng;Bo Zhang;J. Cang;Yuge Zhang;G. Ma;Yue Yang;Wenbo Mo;Zong-qing Zhao
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文献类型：
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作者：
Jiaxing Wen;Ming-hai Yu;Yuchi Wu;M. Zeng;Bo Zhang;J. Cang;Yuge Zhang;G. Ma;Yue Yang;Wenbo Mo;Zong-qing Zhao
The spectrum of laser–plasma generated X-rays is very important, it characterizes electron dynamics in plasma and is basic for applications. However, the accuracies and efficiencies of existing methods to diagnose the spectrum of laser–plasma based X-ray pulse are not very high, especially in the range of several hundred keV. In this study, a new method based on electron tracks detection to measure the spectrum of laser–plasma produced X-ray pulses is proposed and demonstrated. Laser–plasma generated X-rays are scattered in a multi-pixel silicon tracker. Energies and scattering directions of Compton electrons can be extracted from the response of the detector, and then the spectrum of X-rays can be reconstructed. Simulations indicate that the energy resolution of this method is approximately 20% for X-rays from 200 to 550 keV for a silicon-on-insulator pixel detector with 12 μ m pixel pitch and 500 μ m depletion region thickness. The results of a proof-of-principle experiment based on a Timepix3 detector are also shown.
