Valence band offset of ZnO/GaAs heterojunction measured by x-ray photoelectron spectroscopy
Valence band offset of ZnO/GaAs heterojunction measured by x-ray photoelectron spectroscopy
复制标题
X 射线光电子能谱测量 ZnO/GaAs 异质结的价带偏移
作者:
Liu, X. L.;Yang, A. L.;Wei, H. Y.;Yang, S. Y.;Jin, P.;Wang, Z. G.;Zhang, P. F.;Fan, H. B.;Zhang, R. Q.;Zhu, Q. S.