First-principles studies of tip-sample interaction and STM-AFM image formation on TiO 2 ( 110 ) − 1 × 1 and TiO 2 ( 110 ) − 1 × 2 surfaces
First-principles studies of tip-sample interaction and STM-AFM image formation on TiO 2 ( 110 ) − 1 × 1 and TiO 2 ( 110 ) − 1 × 2 surfaces
复制标题
TiO 2 ( 110 ) − 1 × 1 和 TiO 2 ( 110 ) − 1 × 2 表面针尖-样品相互作用和 STM-AFM 图像形成的第一性原理研究
DOI:
10.1103/physrevb.65.125417
复制
发表时间:
2002
影响因子:
3.7
通讯作者:
K. Terakura
中科院分区:
文献类型:
--
作者:
S. Ke;T. Uda;K. Terakura
The tip-sample interaction and scanning tunneling microscopy atomic-force microscopy (STM-AFM) image formation on TiO 2 (110) 1 × I and 1 × 2 surfaces are simulated by using the ultrasoft pseudopotentials plane-wave technique. The effects of spin polarization and bias voltage on the tip-sample interaction in AFM are also investigated. The calculation demonstrates that overall the tip-oxygen interaction is much stronger than the tip-Ti interaction, which determines the main feature of the AFM image formation. The present calculations provide reasonable explanations to a very recent experiment adopting the technique of the combination of STM and AFM.